2015年9月14日,設於德州的專利授權公司 511 Innovations, Inc. (以下稱原告) 於美國聯邦德州東區法院馬歇爾分院提起專利訴訟,指控宏達電 (以下稱被告HTC) 以及CAPELLA MICROSYSTEMS, INC.; VISHAY CAPELLA MICROSYSTEMS (TAIWAN) LIMITED; and VISHAY INTERTECHNOLOGY, INC. (以下稱被告Capella) 侵害原告所持有的4項美國專利,分別如下:
- US7,110,096專利名稱為「透過一個保護障壁以測定光學特性的方法(Method For Determing Optical Characteristics Through A Protective Barrier)」,於2006年09月19日公告,專利申請號為11/235,969,申請日2005年09月26日,優先權日期為1996年01月02日,共有20個權利項,第1項為獨立項。
- US7,397,541專利名稱為「量測物體光學特性的裝置與方法(Apparatus and method for measuring optical characteristics of an object) 」,於2008年07月08日公告,專利申請號為11/523,798,申請日2006年09月18日,優先權日期為1996年01月02日,共有20個權利項,第1項為獨立項。
- US8,472,012專利名稱為「擁有產生首次量測以檢測定位的第一光學感測器以及產生二次量測的光學感測器的裝置(Apparatus having a first optical sensor making a first measurement to detect position and a second optical sensor making a second measurement)」,於2013年06月25日公告,專利申請號為13/597,024,申請日2012年08月28日,優先權日期為1996年01月02日,共有23個權利項,第1項為獨立項。
- US8,786,844專利名稱為「量測光學特性包括定位偵測的裝置(Apparatus for measuring optical characteristics including position detection)」,於2014年07月22日公告,專利申請號為13/604,420,申請日2012年09月05日,優先權日期為1996年01月02日,共有23個權利項,第1項為獨立項。
以上專利發明人皆為Laudermilk, Alan R., Jung, Wayne D., Jung, Russell W.。
原告於訴狀中指出,被告HTC製造、使用、銷售或邀約銷售的產品包括但不限於HTC One X,使用被告Capella生產與銷售的CM3628x光感測器侵害了係爭專利。
圖一、手機光學感測器專利訴訟511 Innovations 控告宏達電與威世光電
![pclass_11607e_20150925.GIF](/Post/Figures/2015/pclass/pclass_11607e_20150925.GIF)
原告進一步指出,系爭專利原先由JJL Technologies, LLC (以下稱”JJL”)所持有,JJL為一低價手持式光測量與感測科技領導廠商,其開發與銷售自家產品,包括全球市場領導的分光光度計以用於量測牙齒、皮膚與其他材質。JJL的發明產生了全球超過80項專利,包括量測多種光學特性與透過透明障壁定位的系統與方法。2013年時JJL將其智慧財產移轉給原告511 Innovations,接著並授權給一家位於德州的Spectral Sensors Inc. 繼續研發與生產光學感測產品。
原告亦以相同系爭專利於同一天同一法院向微軟與三星等提起專利訴訟。
光感測IC廠商凌耀科技(Capella Microsystems)已於2014年7月11日宣布由美商Vishay Intertechnology.Inc(以下稱「Vishay」)及其子公司台灣威世光電(VISHAY CAPELLA MICROSYSTEMS (TAIWAN) LIMITED)簽署合併契約。以溢價幅度21.9%收購,總交易金額約60.5億元。收購作業完成後,台灣威世光電後續將與凌耀正式進行合併,預訂合併案於2015年1月底前完成,合併後由台灣威世光電為存續公司、凌耀為消滅公司,合併後之存續公司名稱為台灣威世光電股份有限公司。(1127字;表3)
表一、專利訴訟案件基本資料:
訴訟名稱 |
511 Innovations, Inc. v. HTC America, Inc. et al |
提告日期 |
2015年9月14日 |
原告 |
511 Innovations, Inc. |
被告 |
HTC AMERICA, INC.; HTC CORPORATION; CAPELLA MICROSYSTEMS, INC.; VISHAY CAPELLA MICROSYSTEMS (TAIWAN) LIMITED; and VISHAY INTERTECHNOLOGY, INC., |
案號 |
2:15-cv-1524 |
訴訟法院 |
Texas Eastern District Court Marshall Division |
系爭專利 |
US7,110,096 B2 US7,397,541 B2 US8,472,012 B2 US8,786,844 B2 |
系爭產品 |
HTC One X; CM3628x sensor; |
訴狀下載 |
![download.gif](/Post/Figures/icon/download.gif) |
Source: 科技政策研究與資訊中心—科技產業資訊室整理,2015/09
二、系爭專利資料
Source: 科技政策研究與資訊中心 — 科技產業資訊室整理,2015/09
表三、系爭專利Claim 1請求項要點解析
US7,110,096 |
Method For Determing Optical Characteristics Through A Protective Barrier 透過一個保護障壁以測定光學特性的方法 |
1. A method for determining optical characteristics of an object, comprising the steps of:
一種方法,以測定物體的光學特性,包括;
positioning a probe in proximity to the object, wherein the probe provides light to the object from one or more light sources, and receives light from the object through one or more light receivers, wherein the one or more light sources and one or more light receivers define at least one minimal height, wherein, when the probe is a distance from the object that is less than the minimal height, light that is reflected from a surface of the object is not propagated by the one more light receivers, wherein the light is provided to the object and received from the object through a protective barrier having a thickness, wherein the thickness is less than the minimal height;
將探針定位在接近此物體,探針提供來自一個或多個光源的光給此物體,並且透過一個或更多的光接收器接收來自物體的光,一個或多個光源以及一個或多個光接收器決定至少一個最低高度,當探針與物體的距離少於此最低高度,反射自物體表面的光並未由一個或多個光接收器傳播,透過一個保護障壁提供給物體以及接收來自物體的光有一個厚度,此厚度少於最低高度;
measuring the intensity of light received and propagated by one of the one or more light receivers;
量測由一個或多個光接收器接收與傳播的光的強度;
determining the optical characteristics of the object based in response to one or more intensity measurements. 基於對一個或多個強度量測的反應決定此物體的光學特性。 |
US7,397,541 |
Apparatus and method for measuring optical characteristics of an object 量測物體光學特性的裝置與方法 |
1. A method for determining optical characteristics of an object, comprising the steps of:
一種方法,用以測定物體的光學特性,包括下列步驟:
providing light to the object from one or more light sources, and receiving light from the object through one or more light receivers, wherein the one or more light sources and one or more light receivers define at least one minimal height, wherein below the minimal height light that is reflected from a surface of the object is not propagated by the one or more light receivers, wherein the light is provided to the object and received from the object through a protective barrier having a thickness, wherein the thickness is less than the minimal height;
從一個或多個光源提供光給物體,並透過一個或多個接收器接收來自物體的光,這一個或多個光源與一個或多個光接收器決定至少一個最低高度,反射自物體表面低於最低高度的光不被一個或多個光接收器傳播,透過一個保護障壁提供給物體以及接收來自物體的光有一個厚度,此厚度少於最低高度;
measuring the intensity of light received and propagated by one of the one or more light receivers;
量測由一個或多個光接收器接收與傳播的光的強度;
determining the optical characteristics of the object based in response to one or more intensity measurements. 基於對一個或多個強度量測的反應決定此物體的光學特性。 |
US8,472,012 |
Apparatus having a first optical sensor making a first measurement to detect position and a second optical sensor making a second measurement 擁有產生首次量測以檢測定位的第一光學感測器以及產生二次量測的光學感測器的裝置 |
1. An apparatus comprising:
一種裝置,包括:
a processor;
一個處理器,
a display coupled to the processor and displaying information to a user of the apparatus;
與處理器一起的顯示裝置顯示資訊給裝置使用者;
at least a first optical sensor making a first measurement, wherein data based on the first measurement is coupled to the processor;
至少一個第一光學感測器產生首次量測,首次量測資料耦合到處理器;
at least a second optical sensor making a second measurement, wherein data based on the second measurement is coupled to the processor;
至少一個第二光學感測器產生第二次量測,第二次量測資料耦合到處理器;
at least one source of illumination operating under control of the processor;
在處理器的控制下至少一個照明源運作;
wherein the source of illumination and the first optical sensor in part determine a minimal distance between the apparatus and an external object such that illumination emitted by the source is not received by the first optical sensor when the apparatus is less than the minimal distance from the external object;
照明源與第一光學感測器決定裝置與外部物體間的最小距離,當裝置與外部物體的距離少於最小距離則來源所投射的光將不被第一光學感測器所接收;
wherein data based on the first measurement made with the first optical sensor determines a position of the apparatus with respect to an object;
第一光學感測器產生的首次測量資料決定裝置與物體間的定位;
wherein data based on the second measurement made with the second optical sensor determines an optical property of light received by the apparatus. 第二光學感測器產生的第二次量測資料決定裝置接收到的光的光學特性。 |
US8,786,844 |
Apparatus for measuring optical characteristics including position detection 量測光學特性包括定位偵測的裝置 |
1. An apparatus comprising:
一種裝置,
包括:
a processor;
一個處理器;
a display coupled to the processor and displaying information to a user of the apparatus;
與處理器一起的顯示裝置顯示資料給裝置使用者;
at least a first optical sensor making a first measurement, wherein data based on the first measurement is coupled to the processor;
至少一個第一光學感測器產生首次量測,首次量測資料耦合到處理器;
at least a second optical sensor making a second measurement, wherein data based on the second measurement is coupled to the processor;
至少一個第二光學感測器產生第二次量測,第二次量測資料耦合到處理器;
at least one source of illumination operating in the IR range of illumination under control of the processor;
在處理器的控制下至少一個照明源在照明紅外線範圍運作;
wherein the source of illumination and the first optical sensor in part determine a minimal distance between the apparatus and an external object such that illumination in the IR range emitted by the source is not received by the first optical sensor when the apparatus is less than the minimal distance from the external object;
照明源與第一光學感測器決定裝置與外部物體間的最小距離,當裝置與外部物體的距離少於最小距離則來源所投射的紅外線範圍光將不被第一光學感測器所接收;
wherein data based on the first measurement made with the first optical sensor determines a position of the apparatus with respect to an object;
第一光學感測器產生的首次測量資料決定裝置與物體間的定位;
wherein the second measurement with the second optical sensor measures light received by the apparatus.
第二光學感測器產生的第二次量測資料量測裝置接收到的光。 |
Source: 科技政策研究與資訊中心—科技產業資訊室整理,2015/09
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